DFT Services | Scan Insertion, ATPG & Fault Coverage Sign-off
Looking for experienced DFT engineering support for ASIC or SoC development?
Silicon Patterns provides end-to-end Design for Test (DFT) services covering DFT planning, scan insertion, ATPG generation, MBIST implementation, JTAG integration, fault simulation, and fault coverage sign-off.
Our team supports semiconductor companies with production-proven DFT methodologies that improve testability, reduce silicon risk, and accelerate validation cycles. With experience across multiple tapeouts, we help customers achieve high fault coverage and reliable silicon implementation.
Core Capabilities:
• DFT Architecture & Planning
• Full & Partial Scan Insertion
• ATPG Pattern Generation
• MBIST Implementation
• JTAG / Boundary Scan
• Fault Simulation
• Fault Coverage Analysis
• ASIC & SoC Test Integration
Industries:
Semiconductors, AI Hardware, Automotive Electronics, Consumer Electronics, and Industrial Systems.